Field emission scanning electron microscope SU5000

Field emission scanning electron microscope SU5000 product features:

1. Secondary electronic resolution: 2.0nm at 1kv

2. Efficient PD-BSD, powerful low acceleration voltage performance, imaging as low as 100V

3. High beam current (>200nA) facilitates efficient micro area analysis

4. Featuring excellent low vacuum (10-300Pa) imaging performance and equipped with a high-sensitivity low vacuum detector (UVD)

5. Open warehouse quick and simple sample change (larger sample size: ф 200mm * 80mmH)

6. Micro area analysis: EDS, WDS, EBSD, etc

If you want more detailed parameters, please contact us for information and quotation. Thank you, we will be happy to serve you!